Thermographic analyses of electronic components and assemblies are already important during the development of the first prototypes. During every step of the development, they provide important conclusions for the optimisation of thermal management and the design of complex electronic assemblies.
In electronics production, thermographic temperature measurement is used for quality assurance, among other methods. Thermography offers decisive advantages both in the setting of critical technological parameters and their permanent monitoring, as well as in the inline testing of products against a golden board and the final functional test. InfraTec`s automated inspection system E-LIT can detect even the smallest thermal defects on semiconductor materials. A special lock-in procedure and a powerful infrared camera ensure shortest inspection times.
By means of lock-in analysis procedure of InfraTec`s IRBIS®